IDEAS home Printed from https://ideas.repec.org/a/taf/tewaxx/v30y2016i3p318-330.html
   My bibliography  Save this article

The dual polarization method for characterization of dielectric materials

Author

Listed:
  • R.A. Fenner
  • E.J. Rothwell
  • L.L. Frasch

Abstract

The nondestructive characterization of in situ conductor-backed media is an important task for many commercial and military applications. These and similar applications may require completely nondestructive and noncontact free space material characterization methods. Free space methods which fit these characteristics are at premium. One such of these methods is the dual polarization method. The dual polarization method utilizes the measurement of the reflection coefficient at both parallel and perpendicular polarization to determine the permittivity and permeability of an unknown material sample. This paper presents an overview of the dual polarization method to characterize conductor-backed media and two additional implementations of the method specific only to dielectric materials. These additional implementations include the characterization of conductor-backed dielectrics with either known or unknown sample thickness. All three implementations of the dual polarization method presented are demonstrated with measured reflection data from a conductor-backed Plexiglas sample and are shown with accompanying sensitivity analysis.

Suggested Citation

  • R.A. Fenner & E.J. Rothwell & L.L. Frasch, 2016. "The dual polarization method for characterization of dielectric materials," Journal of Electromagnetic Waves and Applications, Taylor & Francis Journals, vol. 30(3), pages 318-330, February.
    • Handle: RePEc:taf:tewaxx:v:30:y:2016:i:3:p:318-330
    DOI: 10.1080/09205071.2015.1109005
    as

    Download full text from publisher

    File URL: http://hdl.handle.net/10.1080/09205071.2015.1109005
    Download Restriction: Access to full text is restricted to subscribers.
    File URL: https://libkey.io/10.1080/09205071.2015.1109005?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:tewaxx:v:30:y:2016:i:3:p:318-330. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Longhurst (email available below). General contact details of provider: http://www.tandfonline.com/tewa .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.