IDEAS home Printed from
   My bibliography  Save this article

Measuring the elements of knowledge regimes and their links to technological catch-up: a synthesis based on the East Asian experience


  • Keun Lee


This paper provides a review of the roles of knowledge access and learning as determinants of technological catch-up and focuses on the relationship between the quantifiable measures of elements of the knowledge regimes of sectors and the possibility of catch-up. Catching-up implications of the various elements of knowledge regimes are discussed, after grouping them into two categories: those related to accessibility to the foreign knowledge base (degree of embodied technology transfer and modularity) and those related to the learning possibilities (tacitness of knowledge and cycle time of technologies). We find that catch-up possibilities are positively linked to the accessibility to foreign knowledge base, the degree of embodied technology transfer, and modularity and that a higher degree of knowledge tacitness tends to interfere with learning possibility while the impact of cycle time of technologies would be dubious depending upon the absorption capacity of the latecomers. It is also pointed out that the impact of the knowledge regimes would be different on different types of firms. Policy implications and remaining issues are discussed.

Suggested Citation

  • Keun Lee, 2013. "Measuring the elements of knowledge regimes and their links to technological catch-up: a synthesis based on the East Asian experience," Innovation and Development, Taylor & Francis Journals, vol. 3(1), pages 37-53, April.
  • Handle: RePEc:taf:riadxx:v:3:y:2013:i:1:p:37-53
    DOI: 10.1080/2157930X.2012.713198

    Download full text from publisher

    File URL:
    Download Restriction: Access to full text is restricted to subscribers.

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item


    Access and download statistics


    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:riadxx:v:3:y:2013:i:1:p:37-53. See general information about how to correct material in RePEc.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Chris Longhurst). General contact details of provider: .

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service hosted by the Research Division of the Federal Reserve Bank of St. Louis . RePEc uses bibliographic data supplied by the respective publishers.