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Bayes estimator of process capability index Cpk with a specified prior mean

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  • Shun Matsuura

Abstract

Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

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  • Shun Matsuura, 2023. "Bayes estimator of process capability index Cpk with a specified prior mean," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 52(7), pages 2215-2227, April.
    • Handle: RePEc:taf:lstaxx:v:52:y:2023:i:7:p:2215-2227
    DOI: 10.1080/03610926.2021.1947508
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