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A synthetic control chart for monitoring the small shifts in a process mean based on an attribute inspection

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  • Wenhui Zhou
  • Na Liu
  • Zhibin Zheng

Abstract

In this paper, a synthetic control chart is proposed by integrating the salient features of the npx chart and the CRL chart. The synthetic chart achieves higher detection effectiveness on both small and large mean shifts while retaining the operational simplicity of the attribute charts owing to only using attribute inspection. Both statistical and economic design of the synthetic chart are considered and numerical tests have indicated that the synthetic chart has a higher power for detecting mean shifts than the npx chart, MON chart and CUSUM chart. In addition, sensitivity analyses are also performed under both the statistical and economic design model.

Suggested Citation

  • Wenhui Zhou & Na Liu & Zhibin Zheng, 2020. "A synthetic control chart for monitoring the small shifts in a process mean based on an attribute inspection," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 49(9), pages 2189-2204, May.
    • Handle: RePEc:taf:lstaxx:v:49:y:2020:i:9:p:2189-2204
    DOI: 10.1080/03610926.2019.1568491
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