IDEAS home Printed from https://ideas.repec.org/a/taf/lstaxx/v49y2020i24p5948-5963.html
   My bibliography  Save this article

Optimal threshold determination based on the mean excess plot

Author

Listed:
  • Queensley C. Chukwudum
  • Peter Mwita
  • Joseph K. Mung’atu

Abstract

Choosing a suitable threshold has been an issue in practice. Based on the mean excess plot (MEP), the eyeball inspection approach (EIA) is mainly used to determine the threshold. This involves fitting the threshold at the point the plot becomes approximately linear solely using one’s sense of judgement in such a way that Generalized Pareto model is valid. This is a rather subjective choice. In this paper, we propose an alternative way of selecting the threshold where, instead of choosing individual thresholds in isolation and testing their fit, we make use of the bootstrap aggregate of these individual thresholds which are formulated in terms of quantiles.The method incorporates the visual technique and is aimed at reducing the subjectivity associated with solely using the EIA. The new approach is implemented using simulated datasets drawn from three different distributions. An application to the NSE All share Nigerian stock index is presented. The performance of the proposed model and the EIA are judged based on standard error, Negative log likelihood, the Akaike Information Criteria and the Bayesian Information Criteria. The results show that the new technique gives similar estimates as the EIA and in some cases it performs better. In comparison to other existing methods, the proposed model performs well.

Suggested Citation

  • Queensley C. Chukwudum & Peter Mwita & Joseph K. Mung’atu, 2020. "Optimal threshold determination based on the mean excess plot," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 49(24), pages 5948-5963, December.
  • Handle: RePEc:taf:lstaxx:v:49:y:2020:i:24:p:5948-5963
    DOI: 10.1080/03610926.2019.1624772
    as

    Download full text from publisher

    File URL: http://hdl.handle.net/10.1080/03610926.2019.1624772
    Download Restriction: Access to full text is restricted to subscribers.

    File URL: https://libkey.io/10.1080/03610926.2019.1624772?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:lstaxx:v:49:y:2020:i:24:p:5948-5963. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Longhurst (email available below). General contact details of provider: http://www.tandfonline.com/lsta .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.