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Designing a control chart of extended EWMA statistic based on multiple dependent state sampling

Author

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  • Muhammad Naveed
  • Muhammad Azam
  • Nasrullah Khan
  • Muhammad Aslam

Abstract

In this paper, we presented a memory type control chart (CC) based on multiple dependent state (MDS) sampling to pinpoint the slight variation in the process mean for the quality trait of normal distribution (ND). Two pairs of control limits denominated as internal and external control limits are derived using under control mean and variance. The essential steps are taken to get the value of average run length (ARL) for stable and disturb process. Various tables of ARLs are erected using different smoothing constants, shifts and MDS parameter. Comparisons are established to assess the effectiveness of initiated CC with the various existing CC in term of ARL. It has been ascertained that offered CC manifest the best performance in searching out the diminutive changes in the process mean. Two examples, one is based on simulation study and other is related to real-life data, have been discussed for its practical purpose.

Suggested Citation

  • Muhammad Naveed & Muhammad Azam & Nasrullah Khan & Muhammad Aslam, 2020. "Designing a control chart of extended EWMA statistic based on multiple dependent state sampling," Journal of Applied Statistics, Taylor & Francis Journals, vol. 47(8), pages 1482-1492, June.
    • Handle: RePEc:taf:japsta:v:47:y:2020:i:8:p:1482-1492
    DOI: 10.1080/02664763.2019.1676405
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