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Sequential LND sensitivity test for binary response data

Author

Listed:
  • Lei Wang
  • Yukun Liu
  • Wei Wu
  • Xiaolong Pu

Abstract

Sensitivity tests are used to make inferences about a sensitivity, a characteristic property of some products that cannot be observed directly. For binary response sensitivity data (dead or alive, explode or unexplode), the Langlie and Neyer are two well-known sensitivity tests. The priorities of the Langlie and Neyer tests are investigated in this paper. It is shown that the Langlie test has an advantage in getting an overlap, while the Neyer test has better estimation precision. Aiming at improving both the speed of getting an overlap and the estimation precision, we propose a new sensitivity test which replaces the first part of the Neyer test with the Langlie test. Our simulation studies indicate that the proposed test outperforms the Langlie, Neyer and Dror and Steinberg tests from the viewpoints of estimation precision and probability of obtaining an overlap.

Suggested Citation

  • Lei Wang & Yukun Liu & Wei Wu & Xiaolong Pu, 2013. "Sequential LND sensitivity test for binary response data," Journal of Applied Statistics, Taylor & Francis Journals, vol. 40(11), pages 2372-2384, November.
    • Handle: RePEc:taf:japsta:v:40:y:2013:i:11:p:2372-2384
    DOI: 10.1080/02664763.2013.817546
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