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Combined continuous lot by lot acceptance sampling plan

Author

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  • K. Govindaraju
  • M. Bebbington

Abstract

For production processes involving low fraction non-conforming, the sample sizes of the usual attribute inspection plans are very large. A continuous sampling plan for such processes would also require either a large clearance interval or a large sampling fraction. This paper simplifies the approach of combining the lot by lot and continuous sampling plans recommended by Pesotchinsky (1987) and provides various performance measures for the combined plan. A discussion of the choice of the parameters is also given.

Suggested Citation

  • K. Govindaraju & M. Bebbington, 2000. "Combined continuous lot by lot acceptance sampling plan," Journal of Applied Statistics, Taylor & Francis Journals, vol. 27(6), pages 725-730.
    • Handle: RePEc:taf:japsta:v:27:y:2000:i:6:p:725-730
    DOI: 10.1080/02664760050081906
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    Cited by:

    1. Chen Chung-Ho, 2004. "Minimum Average Fraction Inspected for Combined Continuous Lot by Lot Acceptance Sampling Plan," Stochastics and Quality Control, De Gruyter, vol. 19(1), pages 115-119, January.

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