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Modified tightened two-level continuous sampling plans

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  • S. Balamurali
  • K. Govindaraju

Abstract

In this paper, a modification is proposed on the tightened two-level continuous sampling plan. The tightened two-level plan is one of the three tightened multi-level continuous sampling plans of Derman et al. (1957) with two sampling levels. A modified tightened two-level continuous sampling plan is considered, for which the rules concerning partial inspection depend, in part, on the length of time it takes to decide that the process quality is good enough that 100% inspection may be suspended (e.g. the time required to find i consecutive items free of defects). Using a Markov chain model, expressions for the performance measures of the modified MLP-T-2 plan are derived. The modified MLP-T-2 plan is shown to be identical to the MLP-T-2 plan. Tables are also presented for the selection of the modified MLP-T-2 plan when the AQL or LQL and AOQL are specified.

Suggested Citation

  • S. Balamurali & K. Govindaraju, 2000. "Modified tightened two-level continuous sampling plans," Journal of Applied Statistics, Taylor & Francis Journals, vol. 27(4), pages 397-409.
    • Handle: RePEc:taf:japsta:v:27:y:2000:i:4:p:397-409
    DOI: 10.1080/02664760050003597
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