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Gauge imprecision effect on the performance of the X-S control chart

Author

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  • Hans-Joachim Mittag
  • Dietmar Stemann

Abstract

This paper examines the effect of stochastic measurement error (gauge imprecision) on the performance of Shewhart-type X-S control charts. It is shown that gauge imprecision may seriously affect the ability of the chart to detect process disturbances quickly or, depending on the point in time when the error occurs, the probability of erroneously signalling an out-of-control process state.

Suggested Citation

  • Hans-Joachim Mittag & Dietmar Stemann, 1998. "Gauge imprecision effect on the performance of the X-S control chart," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(3), pages 307-317.
  • Handle: RePEc:taf:japsta:v:25:y:1998:i:3:p:307-317
    DOI: 10.1080/02664769823043
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    Cited by:

    1. Imad Khan & Muhammad Noor-ul-Amin & Dost Muhammad Khan & Salman A. AlQahtani & Mostafa Dahshan & Umair Khalil, 2023. "Monitoring of Location Parameters with a Measurement Error under the Bayesian Approach Using Ranked-Based Sampling Designs with Applications in Industrial Engineering," Sustainability, MDPI, vol. 15(8), pages 1-18, April.
    2. Su-Fen Yang & Li-Pang Chen & Cheng-Kuan Lin, 2023. "Adjustment of Measurement Error Effects on Dispersion Control Chart with Distribution-Free Quality Variable," Sustainability, MDPI, vol. 15(5), pages 1-19, February.
    3. Isabel González & Ismael Sánchez, 2009. "On‐line evaluation of the stability of an inspection process," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 25(6), pages 719-736, November.
    4. Petros E. Maravelakis, 2012. "Measurement error effect on the CUSUM control chart," Journal of Applied Statistics, Taylor & Francis Journals, vol. 39(2), pages 323-336, May.
    5. XueLong Hu & Philippe Castagliola & JinSheng Sun & Michael Boon Chong Khoo, 2016. "Effect of measurement errors on the VSI X chart," European Journal of Industrial Engineering, Inderscience Enterprises Ltd, vol. 10(2), pages 224-242.

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