Research on salient object detection algorithm for complex electrical components
Author
Abstract
Suggested Citation
DOI: 10.1007/s10845-024-02434-y
Download full text from publisher
As the access to this document is restricted, you may want to
for a different version of it.References listed on IDEAS
- Durga Prasad Penumuru & Sreekumar Muthuswamy & Premkumar Karumbu, 2020. "Identification and classification of materials using machine vision and machine learning in the context of industry 4.0," Journal of Intelligent Manufacturing, Springer, vol. 31(5), pages 1229-1241, June.
- Olatomiwa Badmos & Andreas Kopp & Timo Bernthaler & Gerhard Schneider, 2020. "Image-based defect detection in lithium-ion battery electrode using convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 31(4), pages 885-897, April.
Most related items
These are the items that most often cite the same works as this one and are cited by the same works as this one.- Swarit Anand Singh & K. A. Desai, 2023. "Automated surface defect detection framework using machine vision and convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 34(4), pages 1995-2011, April.
- Emmanuel Ekene Okere & Ebrahiema Arendse & Alemayehu Ambaw Tsige & Willem Jacobus Perold & Umezuruike Linus Opara, 2022. "Pomegranate Quality Evaluation Using Non-Destructive Approaches: A Review," Agriculture, MDPI, vol. 12(12), pages 1-25, November.
- Xinyu Suo & Jian Liu & Licheng Dong & Chen Shengfeng & Lu Enhui & Chen Ning, 2022. "A machine vision-based defect detection system for nuclear-fuel rod groove," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1649-1663, August.
- Yun Peng & Shenyi Zhao & Jizhan Liu, 2021. "Fused Deep Features-Based Grape Varieties Identification Using Support Vector Machine," Agriculture, MDPI, vol. 11(9), pages 1-16, September.
- George Lãzãroiu & Armenia Androniceanu & Iulia Grecu & Gheorghe Grecu & Octav Neguri?ã, 2022. "Artificial intelligence-based decision-making algorithms, Internet of Things sensing networks, and sustainable cyber-physical management systems in big data-driven cognitive manufacturing," Oeconomia Copernicana, Institute of Economic Research, vol. 13(4), pages 1047-1080, December.
- Ibrahim Yousif & Liam Burns & Fadi El Kalach & Ramy Harik, 2025. "Leveraging computer vision towards high-efficiency autonomous industrial facilities," Journal of Intelligent Manufacturing, Springer, vol. 36(5), pages 2983-3008, June.
- Nhat-To Huynh, 2024. "A multi-subpopulation genetic algorithm-based CNN approach for ceramic tile defects classification," Journal of Intelligent Manufacturing, Springer, vol. 35(4), pages 1781-1792, April.
- Zhang, Ying & Gao, Kaiye & Ma, Tianyi & Wang, Huan & Li, Yan-Fu, 2024. "Intelligent recognition of structural health state of EV lithium-ion Battery using transfer learning based on X-ray computed tomography," Reliability Engineering and System Safety, Elsevier, vol. 251(C).
- Shuai Ma & Kechen Song & Menghui Niu & Hongkun Tian & Yunhui Yan, 2024. "Cross-scale fusion and domain adversarial network for generalizable rail surface defect segmentation on unseen datasets," Journal of Intelligent Manufacturing, Springer, vol. 35(1), pages 367-386, January.
- Pan, Yue & Kong, Xiangdong & Yuan, Yuebo & Sun, Yukun & Han, Xuebing & Yang, Hongxin & Zhang, Jianbiao & Liu, Xiaoan & Gao, Panlong & Li, Yihui & Lu, Languang & Ouyang, Minggao, 2023. "Detecting the foreign matter defect in lithium-ion batteries based on battery pilot manufacturing line data analyses," Energy, Elsevier, vol. 262(PB).
- Christian Kubik & Sebastian Michael Knauer & Peter Groche, 2022. "Smart sheet metal forming: importance of data acquisition, preprocessing and transformation on the performance of a multiclass support vector machine for predicting wear states during blanking," Journal of Intelligent Manufacturing, Springer, vol. 33(1), pages 259-282, January.
- Seunghwan Jung & Minseok Kim & Eunkyeong Kim & Baekcheon Kim & Jinyong Kim & Kyeong-Hee Cho & Hyang-A Park & Sungshin Kim, 2024. "The Early Detection of Faults for Lithium-Ion Batteries in Energy Storage Systems Using Independent Component Analysis with Mahalanobis Distance," Energies, MDPI, vol. 17(2), pages 1-23, January.
- Zeqing Yang & Mingxuan Zhang & Yingshu Chen & Ning Hu & Lingxiao Gao & Libing Liu & Enxu Ping & Jung Il Song, 2024. "Surface defect detection method for air rudder based on positive samples," Journal of Intelligent Manufacturing, Springer, vol. 35(1), pages 95-113, January.
- Chia-Yu Hsu & Ju-Chien Chien, 2022. "Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification," Journal of Intelligent Manufacturing, Springer, vol. 33(3), pages 831-844, March.
- Yuanyuan Wang & Ling Ma & Lihua Jian & Huiqin Jiang, 2023. "Conductive particle detection via efficient encoder–decoder network," Journal of Intelligent Manufacturing, Springer, vol. 34(8), pages 3563-3577, December.
- Yi Zhang & Peng Peng & Chongdang Liu & Yanyan Xu & Heming Zhang, 2022. "A sequential resampling approach for imbalanced batch process fault detection in semiconductor manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 1057-1072, April.
- Benjamin Lutz & Dominik Kisskalt & Andreas Mayr & Daniel Regulin & Matteo Pantano & Jörg Franke, 2021. "In-situ identification of material batches using machine learning for machining operations," Journal of Intelligent Manufacturing, Springer, vol. 32(5), pages 1485-1495, June.
- Jorge L. Alonso-Perez & Selene L. Cardenas-Maciel & Balter Trujillo-Navarrete & Edgar A. Reynoso-Soto & Nohe R. Cazarez-Cazarez, 2022. "An approach for designing smart manufacturing for the research and development of dye-sensitize solar cell," Journal of Intelligent Manufacturing, Springer, vol. 33(8), pages 2307-2320, December.
- Ruiyang Hao & Bingyu Lu & Ying Cheng & Xiu Li & Biqing Huang, 2021. "A steel surface defect inspection approach towards smart industrial monitoring," Journal of Intelligent Manufacturing, Springer, vol. 32(7), pages 1833-1843, October.
- Minyoung Lee & Joohyoung Jeon & Hongchul Lee, 2022. "Explainable AI for domain experts: a post Hoc analysis of deep learning for defect classification of TFT–LCD panels," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1747-1759, August.
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:joinma:v:36:y:2025:i:6:d:10.1007_s10845-024-02434-y. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .
Please note that corrections may take a couple of weeks to filter through the various RePEc services.
Printed from https://ideas.repec.org/a/spr/joinma/v36y2025i6d10.1007_s10845-024-02434-y.html