IDEAS home Printed from https://ideas.repec.org/a/spr/joinma/v30y2019i3d10.1007_s10845-017-1308-4.html
   My bibliography  Save this article

Nonstationary signal analysis and support vector machine based classification for vibration based characterization and monitoring of slit valves in semiconductor manufacturing

Author

Listed:
  • M. Musselman

    (Lam Research Corporation)

  • H. Xie

    (University of Texas)

  • D. Djurdjanovic

    (University of Texas)

Abstract

Slit valves play an important role in semiconductor manufacturing, enabling creation and maintaining of a vacuum environment required for wafer processing. Due to the high volume of production in the modern semiconductor industry, slit valves could experience severe degradation over their lifetime. If maintenance is not applied in due time, degraded valves may lead to defects in finished products due to pressure loss and particle generation. In this paper, we propose methods for signal processing and feature extraction for analysis of slit valve vibration signals. These methods are then used to demonstrate the ability to reliably, accurately and efficiently distinguish between vibration patterns of each individual valve via a multi-class classification procedure. Furthermore, instantaneous time–frequency entropy of valve vibrations enabled long term monitoring of a slit valve in production, in spite of variations in valve speed and operations.

Suggested Citation

  • M. Musselman & H. Xie & D. Djurdjanovic, 2019. "Nonstationary signal analysis and support vector machine based classification for vibration based characterization and monitoring of slit valves in semiconductor manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 30(3), pages 1099-1110, March.
  • Handle: RePEc:spr:joinma:v:30:y:2019:i:3:d:10.1007_s10845-017-1308-4
    DOI: 10.1007/s10845-017-1308-4
    as

    Download full text from publisher

    File URL: http://link.springer.com/10.1007/s10845-017-1308-4
    File Function: Abstract
    Download Restriction: Access to the full text of the articles in this series is restricted.

    File URL: https://libkey.io/10.1007/s10845-017-1308-4?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Yu Wang & Mingkai Zhang & Xiaowei Tang & Fangyu Peng & Rong Yan, 2022. "A kMap optimized VMD-SVM model for milling chatter detection with an industrial robot," Journal of Intelligent Manufacturing, Springer, vol. 33(5), pages 1483-1502, June.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:joinma:v:30:y:2019:i:3:d:10.1007_s10845-017-1308-4. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.