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Standard Insecurity: How, Why and When Standards can be a Part of the Problem

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  • Dan Lam

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  • Elias Carayannis

Abstract

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Suggested Citation

  • Dan Lam & Elias Carayannis, 2011. "Standard Insecurity: How, Why and When Standards can be a Part of the Problem," Journal of the Knowledge Economy, Springer;Portland International Center for Management of Engineering and Technology (PICMET), vol. 2(2), pages 234-248, June.
  • Handle: RePEc:spr:jknowl:v:2:y:2011:i:2:p:234-248 DOI: 10.1007/s13132-010-0029-0
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    References listed on IDEAS

    as
    1. Sean M. Hackett & David M. Dilts, 2004. "A Systematic Review of Business Incubation Research," The Journal of Technology Transfer, Springer, vol. 29(1), pages 55-82, January.
    2. repec:fth:harver:1473 is not listed on IDEAS
    3. Griliches, Zvi, 1990. "Patent Statistics as Economic Indicators: A Survey," Journal of Economic Literature, American Economic Association, pages 1661-1707.
    4. Lynn, Leonard H. & Mohan Reddy, N. & Aram, John D., 1996. "Linking technology and institutions: the innovation community framework," Research Policy, Elsevier, pages 91-106.
    5. Zvi Griliches, 1998. "Patent Statistics as Economic Indicators: A Survey," NBER Chapters,in: R&D and Productivity: The Econometric Evidence, pages 287-343 National Bureau of Economic Research, Inc.
    6. Chris Freeman & Luc Soete, 1997. "The Economics of Industrial Innovation, 3rd Edition," MIT Press Books, The MIT Press, edition 3, volume 1, number 0262061953, January.
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