IDEAS home Printed from https://ideas.repec.org/a/spr/eurphb/v98y2025i7d10.1140_epjb_s10051-025-00966-7.html
   My bibliography  Save this article

γ-ray irradiation effect on the electrical transport properties of Cu films

Author

Listed:
  • Zhaoguo Li

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Dawei Yan

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Zhiqiang Zhan

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Jiangshan Luo

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Zhiqing Wu

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Fan Lei

    (Institute of Chemical Materials, China Academy of Engineering Physics)

  • Yudan He

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Lei Jin

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Bo Yang

    (Research Center of Laser Fusion, China Academy of Engineering Physics)

  • Qiubo Fu

    (Institute of Chemical Materials, China Academy of Engineering Physics)

Abstract

We reported the electrical transport properties of Cu films under γ-ray irradiation. The temperature dependence of resistance curves coincides with each other before and after irradiation when the irradiation dose is $$\lesssim 3.6\times {10}^{6} \text{rad}(\text{Si})$$ ≲ 3.6 × 10 6 rad ( Si ) . The resistance of the irradiated Cu film is greater than that of the non-irradiated film across the whole temperature range when the irradiation dose is $$\gtrsim 3.6\times {10}^{7} \text{rad}(\text{Si})$$ ≳ 3.6 × 10 7 rad ( Si ) . This phenomenon is caused by the enhanced surface oxidation effect induced by γ-ray irradiation, and this mechanism has been confirmed by chemical composition analysis. Furthermore, the electrical transport properties of Cu films with and without polyimide coverage were measured during γ-ray irradiation. The experimental results showed that the bare Cu film undergoes surface oxidation, while the Cu film covered by polyimide does not. These results further validate the γ-irradiation enhanced oxidation mechanism in Cu films. Graphical abstract The resistance of the irradiated Cu film greater than that of the non-irradiated film was observed in the whole temperature range when irradiation dose is larger than a critical dose. The physical mechanism of above phenomenon is ascribed to the enhanced surface oxidation effect induced by γ-ray irradiation. The electrical transport properties of Cu films with and without polyimide coverage were also measured during γ-ray irradiation. The experimental results showed that the bare Cu film undergoes surface oxidation, while the Cu film covered by polyimide does not. These results further validate the γ-irradiation enhanced oxidation mechanism in Cu films.

Suggested Citation

  • Zhaoguo Li & Dawei Yan & Zhiqiang Zhan & Jiangshan Luo & Zhiqing Wu & Fan Lei & Yudan He & Lei Jin & Bo Yang & Qiubo Fu, 2025. "γ-ray irradiation effect on the electrical transport properties of Cu films," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 98(7), pages 1-8, July.
    • Handle: RePEc:spr:eurphb:v:98:y:2025:i:7:d:10.1140_epjb_s10051-025-00966-7
    DOI: 10.1140/epjb/s10051-025-00966-7
    as

    Download full text from publisher

    File URL: http://link.springer.com/10.1140/epjb/s10051-025-00966-7
    File Function: Abstract
    Download Restriction: Access to the full text of the articles in this series is restricted.
    File URL: https://libkey.io/10.1140/epjb/s10051-025-00966-7?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to

    for a different version of it.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:eurphb:v:98:y:2025:i:7:d:10.1140_epjb_s10051-025-00966-7. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.