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BEEM spectra of various Au-Si samples and their analysis

Author

Listed:
  • A. Thiaville
  • F. Caud
  • C. Vouille
  • J. Miltat

Abstract

Ballistic electron emision microscopy spectra have been measured at room temperature on Au films deposited on the Si(111)-H surface by different procedures. In order to analyze them in detail, we propose a fully analytical description of these spectra, directly based on the phase-space model of Bell and Kaiser. This allows fitting experimental data over a wide voltage range, comprising the threshold and the quasi-linear regions. Two main independent parameters are extracted from the fits, namely the effective Schottky barrier height and hot-electron transmission of the sample. These show a clear variation with sample preparation conditions. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2007

Suggested Citation

  • A. Thiaville & F. Caud & C. Vouille & J. Miltat, 2007. "BEEM spectra of various Au-Si samples and their analysis," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 55(1), pages 29-36, January.
    • Handle: RePEc:spr:eurphb:v:55:y:2007:i:1:p:29-36
    DOI: 10.1140/epjb/e2007-00037-3
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