IDEAS home Printed from https://ideas.repec.org/a/sae/risrel/v228y2014i4p327-336.html
   My bibliography  Save this article

Effects of component placement on solder joint through-life reliability

Author

Listed:
  • Ryan SH Yang
  • Derek R Braden
  • Guang-Ming Zhang
  • David M Harvey

Abstract

Solder joint fatigue is a major concern in circuit board assemblies. A batch of FR4 test boards with different component layouts was assembled. These test boards were then put into an environmental chamber and subjected to thermal cycling. During the test, the samples were removed from the chamber at given intervals and examined by acoustic micro imaging. The solder joint reliability from origin to failure was obtained by processing these acoustic micro imaging data. The impact of different floor plans and component layouts on solder joint reliability were analysed. Remarkably, the results show that the floor plan and component layout have significant influence on solder joint reliability. Components placed in a mirrored configuration in a circuit board assembly have lower reliability than non-overlapping configurations and single-sided assembly. Finally, a stress-based finite element model with two simulation scenarios was carried out to correlate reliability findings with real experimental results.

Suggested Citation

  • Ryan SH Yang & Derek R Braden & Guang-Ming Zhang & David M Harvey, 2014. "Effects of component placement on solder joint through-life reliability," Journal of Risk and Reliability, , vol. 228(4), pages 327-336, August.
  • Handle: RePEc:sae:risrel:v:228:y:2014:i:4:p:327-336
    DOI: 10.1177/1748006X13518769
    as

    Download full text from publisher

    File URL: https://journals.sagepub.com/doi/10.1177/1748006X13518769
    Download Restriction: no

    File URL: https://libkey.io/10.1177/1748006X13518769?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:sae:risrel:v:228:y:2014:i:4:p:327-336. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: SAGE Publications (email available below). General contact details of provider: .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.