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Vulnerability of Surveillance Networks to Faults

Author

Listed:
  • Tai-Lin Chin

    (Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, USA)

  • Thomas Clouqueur

    (Computer Design and Test Laboratory, Nara Institute of Science and Technology, Japan)

  • Parameswaran Ramanathan

    (Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, USA)

  • Kewal K. Saluja

    (Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, USA)

Abstract

Recent advances in technology have made it possible to build surveillance systems using many low-cost sensor nodes with limited computation and communication capabilities. Due to a potentially large number of nodes deployed, node failures are inevitable and can render a surveillance system that has degraded detection performances. The exposure metric has been proposed earlier to assess the quality of a surveillance system based on the detection performances. In this paper, we characterize the vulnerability of a system in terms of its exposure with respect to the number of faulty nodes and their combinations. Specifically, we assess the exposure of a surveillance network subject to a given number of faulty nodes, and identify the worst-case fault combination for both an idling target and a traversing target. For an idling target, the worst-case fault combination and exposure is analytically identified. For a traversing target, a genetic algorithm based approach is proposed to derive a near worst-case fault combination, and extensive simulation results are presented to show the effectiveness of the algorithm.

Suggested Citation

  • Tai-Lin Chin & Thomas Clouqueur & Parameswaran Ramanathan & Kewal K. Saluja, 2006. "Vulnerability of Surveillance Networks to Faults," International Journal of Distributed Sensor Networks, , vol. 2(3), pages 289-311, July.
    • Handle: RePEc:sae:intdis:v:2:y:2006:i:3:p:289-311
    DOI: 10.1080/15501320600692036
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