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Development of multi-frequency impedance scanning electron microscopy

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  • Toshihiko Ogura

Abstract

Nanometre-scale observation of specimens in water is indispensable in many scientific fields like biology, chemistry, material science and nanotechnology. Scanning electron microscopy (SEM) allows high-resolution images of biological samples to be obtained under high vacuum conditions but requires specific sample-preparation protocols. Therefore, there is a need for convenient and minimally invasive methods of observing samples in solution. We have developed a new type of impedance microscopy, namely multi-frequency impedance SEM (IP-SEM), which allows nanoscale imaging of various specimens in water while minimising radiation damage. By varying the frequency of the input voltage signal of the sine wave, the present system can detect dielectric properties of the sample’s composition at nanometre resolution. It also enables examination of unstained biological specimens and material samples in water. Furthermore, it can be used for diverse samples in liquids across a broad range of scientific subjects such as nanoparticles, nanotubes and organic and catalytic materials.

Suggested Citation

  • Toshihiko Ogura, 2022. "Development of multi-frequency impedance scanning electron microscopy," PLOS ONE, Public Library of Science, vol. 17(1), pages 1-15, January.
    • Handle: RePEc:plo:pone00:0263098
    DOI: 10.1371/journal.pone.0263098
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    References listed on IDEAS

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    1. Toshihiko Ogura, 2014. "Direct Observation of Unstained Biological Specimens in Water by the Frequency Transmission Electric-Field Method Using SEM," PLOS ONE, Public Library of Science, vol. 9(3), pages 1-6, March.
    2. Toshihiko Ogura, 2019. "Direct observation of unstained biological samples in water using newly developed impedance scanning electron microscopy," PLOS ONE, Public Library of Science, vol. 14(8), pages 1-17, August.
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    1. Toshihiko Ogura, 2019. "Direct observation of unstained biological samples in water using newly developed impedance scanning electron microscopy," PLOS ONE, Public Library of Science, vol. 14(8), pages 1-17, August.

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