A Count Panel Data Study Of The Schumpeterian Hypothesis
This study estimates the patent-R&D relationship using count panel data. The data is an original panel of 318 firms making R&D investments and applying for patents during the period from 1984 to 1993. A negative binomial model with fixed effects is estimated, taking into account both the discrete nature of the count dependent variable and firm-specific unobserved heterogeneity as well as overdispersion in the data. Firm-level R&D capital, concentration ratios, and various firm size proxies are used as independent variables. Analysis of the data fails to reveal support for the basic tenets of the Schumpeterian Hypothesis. In particular, firm size has a significant negative impact on innovation while industry concentration is statistically insignificant.
Volume (Year): 34 (2003)
Issue (Month): 1 ()
|Contact details of provider:|| Web page: http://nysea.bizland.com/|
More information through EDIRC
References listed on IDEAS
Please report citation or reference errors to , or , if you are the registered author of the cited work, log in to your RePEc Author Service profile, click on "citations" and make appropriate adjustments.:
- Richard Blundell & Rachel Griffith & John Van Reenen, 1994.
"Dynamic count data models of technological innovation,"
IFS Working Papers
W94/10, Institute for Fiscal Studies.
- Blundell, Richard & Griffith, Rachel & Van Reenen, John, 1995. "Dynamic Count Data Models of Technological Innovation," Economic Journal, Royal Economic Society, vol. 105(429), pages 333-44, March.
- Emmanuel DUGUET & Isabelle KABLA, 1998. "Appropriation Strategy and the Motivations to Use the Patent System: An Econometric Analysis at the Firm Level in French Manufacturing," Annals of Economics and Statistics, GENES, issue 49-50, pages 289-327.
- Richard Blundell & Rachel Griffith & John Van Reenen, 1993. "Knowledge stocks, persistent innovation and market dominance: evidence from a panel of British manufacturing firms," IFS Working Papers W93/19, Institute for Fiscal Studies.
- Georg LICHT & Konrad ZOZ, 1998. "Patents and R&D, An Econometric Investigation Using Applications for German, European and US Patents by German Companies," Annals of Economics and Statistics, GENES, issue 49-50, pages 329-360.
- Bruno Crepon & Emmanuel Duguet & Jacques Mairesse, 1998.
"Research, Innovation And Productivity: An Econometric Analysis At The Firm Level,"
Economics of Innovation and New Technology,
Taylor & Francis Journals, vol. 7(2), pages 115-158.
- Bruno Crépon & Emmanuel Duguet & Jacques Mairesse, 1998. "Research, Innovation and Productivity : An Econometric Analysis at the Firm Level," Working Papers 98-33, Centre de Recherche en Economie et Statistique.
- Bruno Crepon & Emmanuel Duguet & Jacques Mairesse, 1998. "Research, Innovation, and Productivity: An Econometric Analysis at the Firm Level," NBER Working Papers 6696, National Bureau of Economic Research, Inc.
- Crepon, B. & Duguet, E., 1995.
"Research and Development, Competition and Innovation; Pseudo Maximum Likelihood and Simulated Maximum Likelihood Methods Applied to Count Data Models with Heterogeneity,"
Papiers d'Economie MathÃ©matique et Applications
95.08, UniversitÃ© PanthÃ©on-Sorbonne (Paris 1).
- Crepon, Bruno & Duguet, Emmanuel, 1997. "Research and development, competition and innovation pseudo-maximum likelihood and simulated maximum likelihood methods applied to count data models with heterogeneity," Journal of Econometrics, Elsevier, vol. 79(2), pages 355-378, August.
- Richard Blundell & Rachel Griffith & Frank Windmeijer, 1999.
"Individual effects and dynamics in count data models,"
IFS Working Papers
W99/03, Institute for Fiscal Studies.
- Blundell, Richard & Griffith, Rachel & Windmeijer, Frank, 2002. "Individual effects and dynamics in count data models," Journal of Econometrics, Elsevier, vol. 108(1), pages 113-131, May.
When requesting a correction, please mention this item's handle: RePEc:nye:nyervw:v:34:y:2003:i:1:p:21-37. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Eryk Wdowiak)
If references are entirely missing, you can add them using this form.