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Nanometric holograms based on a topological insulator material

Author

Listed:
  • Zengji Yue

    (Laboratory of Artificial-Intelligence Nanophotonics and CUDOS (Centre for Ultrahigh bandwidth Devices for Optical Systems), School of Science, RMIT University)

  • Gaolei Xue

    (Laboratory of Artificial-Intelligence Nanophotonics and CUDOS (Centre for Ultrahigh bandwidth Devices for Optical Systems), School of Science, RMIT University
    Beijing Engineering Research Centre for Mixed Reality and Advanced Display, School of Optoelectronics, Beijing Institute of Technology)

  • Juan Liu

    (Beijing Engineering Research Centre for Mixed Reality and Advanced Display, School of Optoelectronics, Beijing Institute of Technology)

  • Yongtian Wang

    (Beijing Engineering Research Centre for Mixed Reality and Advanced Display, School of Optoelectronics, Beijing Institute of Technology)

  • Min Gu

    (Laboratory of Artificial-Intelligence Nanophotonics and CUDOS (Centre for Ultrahigh bandwidth Devices for Optical Systems), School of Science, RMIT University)

Abstract

Holography has extremely extensive applications in conventional optical instruments spanning optical microscopy and imaging, three-dimensional displays and metrology. To integrate holography with modern low-dimensional electronic devices, holograms need to be thinned to a nanometric scale. However, to keep a pronounced phase shift modulation, the thickness of holograms has been generally limited to the optical wavelength scale, which hinders their integration with ultrathin electronic devices. Here, we break this limit and achieve 60 nm holograms using a topological insulator material. We discover that nanometric topological insulator thin films act as an intrinsic optical resonant cavity due to the unequal refractive indices in their metallic surfaces and bulk. The resonant cavity leads to enhancement of phase shifts and thus the holographic imaging. Our work paves a way towards integrating holography with flat electronic devices for optical imaging, data storage and information security.

Suggested Citation

  • Zengji Yue & Gaolei Xue & Juan Liu & Yongtian Wang & Min Gu, 2017. "Nanometric holograms based on a topological insulator material," Nature Communications, Nature, vol. 8(1), pages 1-5, August.
    • Handle: RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_ncomms15354
    DOI: 10.1038/ncomms15354
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    Cited by:

    1. Georgy Ermolaev & Kirill Voronin & Denis G. Baranov & Vasyl Kravets & Gleb Tselikov & Yury Stebunov & Dmitry Yakubovsky & Sergey Novikov & Andrey Vyshnevyy & Arslan Mazitov & Ivan Kruglov & Sergey Zhu, 2022. "Topological phase singularities in atomically thin high-refractive-index materials," Nature Communications, Nature, vol. 13(1), pages 1-9, December.

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