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In-line three-dimensional holography of nanocrystalline objects at atomic resolution

Author

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  • F.-R. Chen

    (National Tsing-Hua University, 101 Kuang-Fu Road, Hsin Chu 300, Taiwan)

  • D. Van Dyck

    (EMAT, University of Antwerp)

  • C. Kisielowski

    (Lawrence Berkeley National Laboratory, The Molecular Foundry and Joint Center for Artificial Photosynthesis)

Abstract

Resolution and sensitivity of the latest generation aberration-corrected transmission electron microscopes allow the vast majority of single atoms to be imaged with sub-Ångstrom resolution and their locations determined in an image plane with a precision that exceeds the 1.9-pm wavelength of 300 kV electrons. Such unprecedented performance allows expansion of electron microscopic investigations with atomic resolution into the third dimension. Here we report a general tomographic method to recover the three-dimensional shape of a crystalline particle from high-resolution images of a single projection without the need for sample rotation. The method is compatible with low dose rate electron microscopy, which improves on signal quality, while minimizing electron beam-induced structure modifications even for small particles or surfaces. We apply it to germanium, gold and magnesium oxide particles, and achieve a depth resolution of 1–2 Å, which is smaller than inter-atomic distances.

Suggested Citation

  • F.-R. Chen & D. Van Dyck & C. Kisielowski, 2016. "In-line three-dimensional holography of nanocrystalline objects at atomic resolution," Nature Communications, Nature, vol. 7(1), pages 1-11, April.
    • Handle: RePEc:nat:natcom:v:7:y:2016:i:1:d:10.1038_ncomms10603
    DOI: 10.1038/ncomms10603
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