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Carbon nanotube network-silicon oxide non-volatile switches

Author

Listed:
  • Albert D. Liao

    (Research Laboratory of Electronics, MIT)

  • Paulo T. Araujo

    (Research Laboratory of Electronics, MIT
    University of Alabama)

  • Runjie Xu

    (Research Laboratory of Electronics, MIT)

  • Mildred S. Dresselhaus

    (Research Laboratory of Electronics, MIT)

Abstract

The integration of carbon nanotubes with silicon is important for their incorporation into next-generation nano-electronics. Here we demonstrate a non-volatile switch that utilizes carbon nanotube networks to electrically contact a conductive nanocrystal silicon filament in silicon dioxide. We form this device by biasing a nanotube network until it physically breaks in vacuum, creating the conductive silicon filament connected across a small nano-gap. From Raman spectroscopy, we observe coalescence of nanotubes during breakdown, which stabilizes the system to form very small gaps in the network~15 nm. We report that carbon nanotubes themselves are involved in switching the device to a high resistive state. Calculations reveal that this switching event occurs at ~600 °C, the temperature associated with the oxidation of nanotubes. Therefore, we propose that, in switching to a resistive state, the nanotube oxidizes by extracting oxygen from the substrate.

Suggested Citation

  • Albert D. Liao & Paulo T. Araujo & Runjie Xu & Mildred S. Dresselhaus, 2014. "Carbon nanotube network-silicon oxide non-volatile switches," Nature Communications, Nature, vol. 5(1), pages 1-6, December.
  • Handle: RePEc:nat:natcom:v:5:y:2014:i:1:d:10.1038_ncomms6673
    DOI: 10.1038/ncomms6673
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