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Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers

Author

Listed:
  • R. Riedel

    (Universität Hamburg, Luruper Chaussee 149
    Helmholtz-Institut Jena, Max-Wien-Platz 1)

  • A. Al-Shemmary

    (Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany)

  • M. Gensch

    (Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstrasse 400)

  • T. Golz

    (Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany)

  • M. Harmand

    (Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany)

  • N. Medvedev

    (Center for Free-Electron Laser Science/DESY Notkestraße 85)

  • M. J. Prandolini

    (Helmholtz-Institut Jena, Max-Wien-Platz 1)

  • K. Sokolowski-Tinten

    (Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen)

  • S. Toleikis

    (Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany)

  • U. Wegner

    (Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany)

  • B. Ziaja

    (Center for Free-Electron Laser Science/DESY Notkestraße 85
    Institute of Nuclear Physics, PAN, Radzikowskiego 152)

  • N. Stojanovic

    (Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany)

  • F. Tavella

    (Helmholtz-Institut Jena, Max-Wien-Platz 1)

Abstract

The resolution of ultrafast studies performed at extreme ultraviolet and X-ray free-electron lasers is still limited by shot-to-shot variations of the temporal pulse characteristics. Here we show a versatile single-shot temporal diagnostic tool that allows the determination of the extreme ultraviolet pulse duration and the relative arrival time with respect to an external pump-probe laser pulse. This method is based on time-resolved optical probing of the transient reflectivity change due to linear absorption of the extreme ultraviolet pulse within a solid material. In this work, we present measurements performed at the FLASH free-electron laser. We determine the pulse duration at two distinct wavelengths, yielding (184±14) fs at 41.5 nm and (21±19) fs at 5.5 nm. Furthermore, we demonstrate the feasibility to operate the tool as an online diagnostic by using a 20-nm-thin Si3N4 membrane as target. Our results are supported by detailed numerical and analytical investigations.

Suggested Citation

  • R. Riedel & A. Al-Shemmary & M. Gensch & T. Golz & M. Harmand & N. Medvedev & M. J. Prandolini & K. Sokolowski-Tinten & S. Toleikis & U. Wegner & B. Ziaja & N. Stojanovic & F. Tavella, 2013. "Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers," Nature Communications, Nature, vol. 4(1), pages 1-7, June.
    • Handle: RePEc:nat:natcom:v:4:y:2013:i:1:d:10.1038_ncomms2754
    DOI: 10.1038/ncomms2754
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