Author
Listed:
- Jiahao Geng
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Donghao Ma
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Meng Xu
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Zhihui Gao
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Long Zhou
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Zixuan Jia
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Mengyao Liu
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Zhiyu Zheng
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Wei Zheng
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Huaiyu Zhang
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Xinkai Peng
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Chen Li
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Dou Zhao
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering
The University of Tokyo, Department of Electrical Engineering and Information Systems)
- Wanqi Jie
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
- Yadong Xu
(Northwestern Polytechnical University, State Key Laboratory of Solidification Processing, School of Materials Science and Engineering
Northwestern Polytechnical University, MIIT Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering)
Abstract
Pure-organic semiconductors have attracted broad interest in tissue-equivalent and biocompatible X-ray sensors, while their low-dose X-ray imaging capability still suffers from poor charge transport properties. Here, we report a dimensionality tailoring method to enhance hole transport in pure-organic semiconductors, enabling highly stable and low-dose X-ray detection and imaging without toxic elements such as Pb or Hg. By substituting the -CN group in 4-hydroxycyanobenzene (4HCB, HO-C6H4-CN) with a -COOCH3 group, we transform the two-dimensional (2D) structure into a three-dimensional (3D) 4-methyl hydroxybenzoate (4MHB, HO-C6H4-COOCH3) crystal featuring enhanced intermolecular π-π stacking. This structural reconfiguration yields a high hole mobility of 19.91 cm2 V−1 s−1 and an ultralow dark current drift of 1.14 × 10−10 nA cm−1 s−1 V−1 at 100 V mm−1. The superior charge transport facilitated by stronger π-π interactions enables stable X-ray detection with a detection limit as low as 4.22 nGyair s−1 and high-resolution imaging at 1.6 lp mm−1 under low-dose irradiation (58.76 μGyair s−1). This work demonstrates a molecular tailoring strategy to modulate the structural dimensionality and the charge transport path of pure-organic semiconductors, advancing tissue-equivalence and biocompatible X-ray imagers toward high-resolution and low-dose operation.
Suggested Citation
Jiahao Geng & Donghao Ma & Meng Xu & Zhihui Gao & Long Zhou & Zixuan Jia & Mengyao Liu & Zhiyu Zheng & Wei Zheng & Huaiyu Zhang & Xinkai Peng & Chen Li & Dou Zhao & Wanqi Jie & Yadong Xu, 2025.
"Dimensionality-tailored pure organic semiconductor with high hole mobility for low-dose x-ray imaging,"
Nature Communications, Nature, vol. 16(1), pages 1-11, December.
Handle:
RePEc:nat:natcom:v:16:y:2025:i:1:d:10.1038_s41467-025-65349-z
DOI: 10.1038/s41467-025-65349-z
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