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Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy

Author

Listed:
  • Omid Zandi

    (University of Illinois at Urbana-Champaign
    University of Illinois at Urbana-Champaign)

  • Allan E. Sykes

    (University of Illinois at Urbana-Champaign
    University of Illinois at Urbana-Champaign)

  • Ryan D. Cornelius

    (University of Illinois at Urbana-Champaign
    University of Illinois at Urbana-Champaign)

  • Francis M. Alcorn

    (University of Illinois at Urbana-Champaign
    University of Illinois at Urbana-Champaign)

  • Brandon S. Zerbe

    (Michigan State University)

  • Phillip M. Duxbury

    (Michigan State University)

  • Bryan W. Reed

    (Integrated Dynamic Electron Solutions, Inc. (IDES))

  • Renske M. van der Veen

    (University of Illinois at Urbana-Champaign
    University of Illinois at Urbana-Champaign
    University of Illinois at Urbana-Champaign)

Abstract

Understanding and controlling ultrafast charge carrier dynamics is of fundamental importance in diverse fields of (quantum) science and technology. Here, we create a three-dimensional hot electron gas through two-photon photoemission from a copper surface in vacuum. We employ an ultrafast electron microscope to record movies of the subsequent electron dynamics on the picosecond-nanosecond time scale. After a prompt Coulomb explosion, the subsequent dynamics is characterized by a rapid oblate-to-prolate shape transformation of the electron gas, and periodic and long-lived electron cyclotron oscillations inside the magnetic field of the objective lens. In this regime, the collective behavior of the oscillating electrons causes a transient, mean-field lensing effect and pronounced distortions in the images. We derive an analytical expression for the time-dependent focal length of the electron-gas lens, and perform numerical electron dynamics and probe image simulations to determine the role of Coulomb self-fields and image charges. This work inspires the visualization of cyclotron dynamics inside two-dimensional electron-gas materials and enables the elucidation of electron/plasma dynamics and properties that could benefit the development of high-brightness electron and X-ray sources.

Suggested Citation

  • Omid Zandi & Allan E. Sykes & Ryan D. Cornelius & Francis M. Alcorn & Brandon S. Zerbe & Phillip M. Duxbury & Bryan W. Reed & Renske M. van der Veen, 2020. "Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy," Nature Communications, Nature, vol. 11(1), pages 1-11, December.
  • Handle: RePEc:nat:natcom:v:11:y:2020:i:1:d:10.1038_s41467-020-16746-z
    DOI: 10.1038/s41467-020-16746-z
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