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Optimal Control of a Manufacturing Process That Involves Trial Runs

Author

Listed:
  • Guillermo Gallego

    (Department of Industrial Engineering and Operations Research, Columbia University, New York, New York 10027-6699)

  • David D. Yao

    (Department of Industrial Engineering and Operations Research, Columbia University, New York, New York 10027-6699)

  • Ilkyeong Moon

    (Department of Industrial Engineering and Operations Research, Columbia University, New York, New York 10027-6699)

Abstract

We study a manufacturing process that is quite common in semiconductor wafer fabrication. In generic terms, the job to be processed consists of J units. To process the job, a "setup" is required, followed by routine processing and testing. In principle, the entirety of the job can be set up and processed in a single batch. However, the setup is prone to failure, leading to loss of units. Hence, in practice trial runs are often conducted, with each trial involving a small batch of units. Here we identify an optimal control of such processes. The policy prescribes a maximum of k* (\le J) single-unit trial runs. To establish optimality, we use the recently developed notion of stochastic convexity/concavity and related machinery.

Suggested Citation

  • Guillermo Gallego & David D. Yao & Ilkyeong Moon, 1993. "Optimal Control of a Manufacturing Process That Involves Trial Runs," Management Science, INFORMS, vol. 39(12), pages 1499-1505, December.
    • Handle: RePEc:inm:ormnsc:v:39:y:1993:i:12:p:1499-1505
    DOI: 10.1287/mnsc.39.12.1499
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