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Conformal Segmentation in Industrial Surface Defect Detection with Statistical Guarantees

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  • Cheng Shen

    (School of Information Science & Engineering, Lanzhou University Yuzhong Campus, Lanzhou 730107, China)

  • Yuewei Liu

    (School of Mathematics and Statistics, Lanzhou University, Lanzhou 730000, China)

Abstract

Detection of surface defects can significantly elongate mechanical service time and mitigate potential risks during safety management. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low efficiency and high costs. Some machine learning algorithms and artificial intelligence models for defect detection, such as Convolutional Neural Networks (CNNs), present outstanding performance, but they are often data-dependent and cannot provide guarantees for new test samples. To this end, we construct a detection model by combining Mask R-CNN, selected for its strong baseline performance in pixel-level segmentation, with Conformal Risk Control. The former evaluates the distribution that discriminates defects from all samples based on probability. The detection model is improved by retraining with calibration data that is assumed to be independent and identically distributed (i.i.d) with the test data. The latter constructs a prediction set on which a given guarantee for detection will be obtained. First, we define a loss function for each calibration sample to quantify detection error rates. Subsequently, we derive a statistically rigorous threshold by optimization of error rates and a given guarantee significance as the risk level. With the threshold, defective pixels with high probability in test images are extracted to construct prediction sets. This methodology ensures that the expected error rate on the test set remains strictly bounded by the predefined risk level. Furthermore, our model shows robust and efficient control over the expected test set error rate when calibration-to-test partitioning ratios vary.

Suggested Citation

  • Cheng Shen & Yuewei Liu, 2025. "Conformal Segmentation in Industrial Surface Defect Detection with Statistical Guarantees," Mathematics, MDPI, vol. 13(15), pages 1-22, July.
  • Handle: RePEc:gam:jmathe:v:13:y:2025:i:15:p:2430-:d:1711807
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