Author
Listed:
- Kun Zhao
(The State Key Laboratory of Insulation and Power Equipment, School of the Electrical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Department of Electronics and Telecommunications, Politecnico di Torino, 10129 Turin, Italy)
- Stefano Grivet-Talocia
(Department of Electronics and Telecommunications, Politecnico di Torino, 10129 Turin, Italy)
- Paolo Manfredi
(Department of Electronics and Telecommunications, Politecnico di Torino, 10129 Turin, Italy)
- Yuan Yan
(The State Key Laboratory of Insulation and Power Equipment, School of the Electrical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Department of Electronics and Telecommunications, Politecnico di Torino, 10129 Turin, Italy)
- Hongjie Li
(The State Key Laboratory of Insulation and Power Equipment, School of the Electrical Engineering, Xi’an Jiaotong University, Xi’an 710049, China)
Abstract
Cable shields may develop holes when the sheath is damaged. Time–frequency domain reflectometry (TFDR) is an effective method for detecting cable defects, but it cannot directly evaluate hole sizes. To address this issue, we analyze the impact of shield hole sizes on TFDR signals. Building on this analysis, we propose an improved dual-frequency TFDR method to measure shield holes and evaluate their sizes. This method directly measures the characteristic impedances and damage ratios using dual-frequency TFDR, followed by a two-step evaluation process to determine the hole center angles and lengths based on these measurements. Simulations and experiments validate the proposed method. In laboratory-scale experiments using a scaled cable model, and considering measurement noise, the maximum relative errors for shield hole length and center angle are 11% and 5%, respectively.
Suggested Citation
Kun Zhao & Stefano Grivet-Talocia & Paolo Manfredi & Yuan Yan & Hongjie Li, 2025.
"Detection and Evaluation of Shield Damage Defects in Power Cables Using an Improved Dual-Frequency Time–Frequency Domain Reflectometry,"
Energies, MDPI, vol. 18(19), pages 1-15, September.
Handle:
RePEc:gam:jeners:v:18:y:2025:i:19:p:5214-:d:1762112
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