IDEAS home Printed from https://ideas.repec.org/a/gam/jeners/v18y2025i13p3470-d1692457.html
   My bibliography  Save this article

Sensorless Dual TSEP ( V th , R dson ) Implementation for Junction Temperature Measurement in Parallelized SiC MOSFETs

Author

Listed:
  • Louis Alauzet

    (Icam School of Engineering, Toulouse Campus, 31300 Toulouse, France
    LAAS-CNRS, ESE, Université De Toulouse, 31031 Toulouse, France)

  • Patrick Tounsi

    (LAAS-CNRS, ESE, Université De Toulouse, 31031 Toulouse, France)

  • Jean-Pierre Fradin

    (Icam School of Engineering, Toulouse Campus, 31300 Toulouse, France)

Abstract

This article presents a method for detecting the temperature distribution of two parallelized Silicon Carbide (SiC) MOSFETs. Two thermally sensitive electrical parameters (TSEPs), namely the on-state resistance ( R d s o n ) and the threshold voltage ( V t h ), are introduced. A comparison of the temperatures interpolated by V t h and R d s o n shows disparity, enabling the detection of individual junction temperatures. V t h instability and its measurement are discussed for SiC devices. Experimental results show that, depending on the instability of the V t h and the sensitivity of the two TSEPs at certain temperatures, a combination of different TSEPs could be a solution for extracting the maximum junction temperature of parallelized devices.

Suggested Citation

  • Louis Alauzet & Patrick Tounsi & Jean-Pierre Fradin, 2025. "Sensorless Dual TSEP ( V th , R dson ) Implementation for Junction Temperature Measurement in Parallelized SiC MOSFETs," Energies, MDPI, vol. 18(13), pages 1-15, July.
    • Handle: RePEc:gam:jeners:v:18:y:2025:i:13:p:3470-:d:1692457
    as

    Download full text from publisher

    File URL: https://www.mdpi.com/1996-1073/18/13/3470/pdf
    Download Restriction: no
    File URL: https://www.mdpi.com/1996-1073/18/13/3470/
    Download Restriction: no
    ---><---

    More about this item

    Keywords

    ;
    ;
    ;
    ;
    ;
    ;

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:gam:jeners:v:18:y:2025:i:13:p:3470-:d:1692457. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: MDPI Indexing Manager (email available below). General contact details of provider: https://www.mdpi.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.