IDEAS home Printed from https://ideas.repec.org/a/gam/jeners/v12y2019i9p1791-d230231.html
   My bibliography  Save this article

A Method to Monitor IGBT Module Bond Wire Failure Using On-State Voltage Separation Strategy

Author

Listed:
  • Qingyi Kong

    (Tianjin Key Laboratory of Control Theory & Applications in Complicated System, Tianjin University of Technology, Tianjin 300384, China)

  • Mingxing Du

    (Tianjin Key Laboratory of Control Theory & Applications in Complicated System, Tianjin University of Technology, Tianjin 300384, China)

  • Ziwei Ouyang

    (Tianjin Key Laboratory of Control Theory & Applications in Complicated System, Tianjin University of Technology, Tianjin 300384, China
    Department of Electrical Engineering, Technical University of Denmark, 2800 Kgs Lyngby, Denmark)

  • Kexin Wei

    (Tianjin Key Laboratory of Control Theory & Applications in Complicated System, Tianjin University of Technology, Tianjin 300384, China)

  • William Gerard Hurley

    (Tianjin Key Laboratory of Control Theory & Applications in Complicated System, Tianjin University of Technology, Tianjin 300384, China
    Department of Electrical Engineering, The National University of Ireland, H91 TK33 Galway, Ireland)

Abstract

On-state voltage is an important thermal parameter for insulated gate bipolar transistor (IGBT) modules. It is employed widely to predict failure in IGBT module bond wires. However, due to restrictions in work environments and measurement methods, it is difficult to ensure the measurement accuracy for the on-state voltage under practical working conditions. To address this problem, an on-state voltage separation strategy is proposed for the IGBT modules with respect to the influence of collector current ( I c ) and junction temperature ( T j ). This method involves the separation of the on-state voltage into a dependent part and two independent parts during the IGBT module bond wire prediction. Based on the proposed separation strategy, the independent parts in the failure prediction can be removed, making it possible to directly monitor the voltage variations caused by bond wire failure. The experimental results demonstrate that the proposed diagnosis strategy can accurately predict the bond wire failure stage in an IGBT module under different conditions.

Suggested Citation

  • Qingyi Kong & Mingxing Du & Ziwei Ouyang & Kexin Wei & William Gerard Hurley, 2019. "A Method to Monitor IGBT Module Bond Wire Failure Using On-State Voltage Separation Strategy," Energies, MDPI, vol. 12(9), pages 1-13, May.
    • Handle: RePEc:gam:jeners:v:12:y:2019:i:9:p:1791-:d:230231
    as

    Download full text from publisher

    File URL: https://www.mdpi.com/1996-1073/12/9/1791/pdf
    Download Restriction: no
    File URL: https://www.mdpi.com/1996-1073/12/9/1791/
    Download Restriction: no
    ---><---

    References listed on IDEAS

    as
    1. Qingyi Kong & Mingxing Du & Ziwei Ouyang & Kexin Wei & William Gerard Hurley, 2019. "A Model of the On-State Voltage across IGBT Modules Based on Physical Structure and Conduction Mechanisms," Energies, MDPI, vol. 12(5), pages 1-15, March.
    Full references (including those not matched with items on IDEAS)

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Zilang Hu & Xinglai Ge & Dong Xie & Yichi Zhang & Bo Yao & Jian Dai & Fengbo Yang, 2019. "An Aging-Degree Evaluation Method for IGBT Bond Wire with Online Multivariate Monitoring," Energies, MDPI, vol. 12(20), pages 1-18, October.
    2. Xingliang Liu & Guiyun Tian & Yu Chen & Haoze Luo & Jian Zhang & Wuhua Li, 2020. "Non-Contact Degradation Evaluation for IGBT Modules Using Eddy Current Pulsed Thermography Approach," Energies, MDPI, vol. 13(10), pages 1-14, May.

    Most related items

    These are the items that most often cite the same works as this one and are cited by the same works as this one.

      Corrections

      All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:gam:jeners:v:12:y:2019:i:9:p:1791-:d:230231. See general information about how to correct material in RePEc.

      If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

      If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .

      If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

      For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: MDPI Indexing Manager (email available below). General contact details of provider: https://www.mdpi.com .

      Please note that corrections may take a couple of weeks to filter through the various RePEc services.

      IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.