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Measurement Error Estimation for Capacitive Voltage Transformer by Insulation Parameters

Author

Listed:
  • Bin Chen

    (State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China)

  • Lin Du

    (State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China)

  • Kun Liu

    (Sichuan Electric Power Corporation Metering Center of State Grid, Chengdu 610045, China)

  • Xianshun Chen

    (Sichuan Electric Power Corporation Metering Center of State Grid, Chengdu 610045, China)

  • Fuzhou Zhang

    (Sichuan Electric Power Corporation Metering Center of State Grid, Chengdu 610045, China)

  • Feng Yang

    (State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China)

Abstract

Measurement errors of a capacitive voltage transformer (CVT) are relevant to its equivalent parameters for which its capacitive divider contributes the most. In daily operation, dielectric aging, moisture, dielectric breakdown, etc., it will exert mixing effects on a capacitive divider’s insulation characteristics, leading to fluctuation in equivalent parameters which result in the measurement error. This paper proposes an equivalent circuit model to represent a CVT which incorporates insulation characteristics of a capacitive divider. After software simulation and laboratory experiments, the relationship between measurement errors and insulation parameters is obtained. It indicates that variation of insulation parameters in a CVT will cause a reasonable measurement error. From field tests and calculation, equivalent capacitance mainly affects magnitude error, while dielectric loss mainly affects phase error. As capacitance changes 0.2%, magnitude error can reach −0.2%. As dielectric lo s s factor changes 0.2%, phase error can reach 5′. An increase of equivalent capacitance and dielectric loss factor in the high-voltage capacitor will cause a positive real power measurement error. An increase of equivalent capacitance and dielectric loss factor in the low-voltage capacitor will cause a negative real power measurement error.

Suggested Citation

  • Bin Chen & Lin Du & Kun Liu & Xianshun Chen & Fuzhou Zhang & Feng Yang, 2017. "Measurement Error Estimation for Capacitive Voltage Transformer by Insulation Parameters," Energies, MDPI, vol. 10(3), pages 1-14, March.
  • Handle: RePEc:gam:jeners:v:10:y:2017:i:3:p:357-:d:92948
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    Citations

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    Cited by:

    1. Jun He & Zhihao Zhou & Chao Tong & Fan Li & Fangxi Rao & Qiu Xu, 2023. "Online Evaluation Method of CVT Internal Insulation Abnormality Based on Self-Supervised Learning," Energies, MDPI, vol. 16(12), pages 1-15, June.
    2. Bart Verhelst & Sané Rens & Johan Rens & Jos Knockaert & Jan Desmet, 2023. "On the Remote Calibration of Instrumentation Transformers: Influence of Temperature," Energies, MDPI, vol. 16(12), pages 1-17, June.

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