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Experimental Spectroscopic Data of SnO 2 Films and Powder

Author

Listed:
  • Hawazin Alghamdi

    (Department of Physics and Astronomy, Howard University, Washington, DC 20059, USA)

  • Olasunbo Z. Farinre

    (Department of Physics and Astronomy, Howard University, Washington, DC 20059, USA)

  • Mathew L. Kelley

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
    Theiss Research, La Jolla, CA 92037, USA)

  • Adam J. Biacchi

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA)

  • Dipanjan Saha

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA)

  • Tehseen Adel

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA)

  • Kerry Siebein

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA)

  • Angela R. Hight Walker

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA)

  • Christina A. Hacker

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA)

  • Albert F. Rigosi

    (Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA)

  • Prabhakar Misra

    (Department of Physics and Astronomy, Howard University, Washington, DC 20059, USA)

Abstract

Powders and films composed of tin dioxide (SnO 2 ) are promising candidates for a variety of high-impact applications, and despite the material’s prevalence in such studies, it remains of high importance that commercially available materials meet the quality demands of the industries that these materials would most benefit. Imaging techniques, such as scanning electron microscopy (SEM), atomic force microscopy (AFM), were used in conjunction with Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) to assess the quality of a variety of samples, such as powder and thin film on quartz with thicknesses of 41 nm, 78 nm, 97 nm, 373 nm, and 908 nm. In this study, the dependencies of the corresponding Raman, XPS, and SEM analysis results on properties of the samples, like the thickness and form (powder versus film) are determined. The outcomes achieved can be regarded as a guide for performing quality checks of such products, and as reference to evaluate commercially available samples.

Suggested Citation

  • Hawazin Alghamdi & Olasunbo Z. Farinre & Mathew L. Kelley & Adam J. Biacchi & Dipanjan Saha & Tehseen Adel & Kerry Siebein & Angela R. Hight Walker & Christina A. Hacker & Albert F. Rigosi & Prabhakar, 2023. "Experimental Spectroscopic Data of SnO 2 Films and Powder," Data, MDPI, vol. 8(2), pages 1-15, February.
    • Handle: RePEc:gam:jdataj:v:8:y:2023:i:2:p:37-:d:1062806
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