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Investigation on Structural, Morphological and Optical Properties of Nanostructured Sn Doped ZnO Thin Films

Author

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  • Rupali R. Katkar
  • Prathviraj L. Sarwade
  • Vishwanath D. Mote
  • Kamlakar N. Shivalkar

Abstract

Sn-doped ZnO thin films have been deposited on glass substrates using the spray pyrolysis technique and their structural, optical and morphological properties were systematically investigated. X-ray diffraction analysis revealed the formation of a polycrystalline ZnO thin films with a hexagonal (wurtzite) structure of ZnO and a preferred orientation along the (101) plane. The XRD results confirmed that, Sn ions were successfully incorporated into the ZnO crystal lattice without forming any impurity phases indicating high phase purity. UV–Vis spectroscopic studies confirm that the strong absorption in the UV region which shows the characteristics of a wide band gap semiconductor. FESEM images shows that revealed a compact and uniformly distributed granular morphology. Based on this study, Sn doping of the structural integrity and optical performance of ZnO thin films which highlighting their potential for optoelectronic devices.

Suggested Citation

  • Rupali R. Katkar & Prathviraj L. Sarwade & Vishwanath D. Mote & Kamlakar N. Shivalkar, 2026. "Investigation on Structural, Morphological and Optical Properties of Nanostructured Sn Doped ZnO Thin Films," International Journal of Scientific Research in Science and Technology, Technoscience Academy, vol. 13(3), pages 844-849, June.
    • Handle: RePEc:etm:ijsrst:v13:y2026:i3:id:1674
    DOI: 10.32628/IJSRST26133211
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