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Patent activity by date of application -- Estimating recent applications in the U.S. patent system

Listed author(s):
  • Levine, L. O.
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    Using the number of patents applied for each year can be a useful indicator of the level of inventive effort and a more accurate measure than one based on patent issue date. In the U.S. patent system, this indicator is hampered by the closed examination process, which results in an undercounting of applications field in the recent past. This article describes a method for overcoming this problem by estimating recent patent activity by date of application for U.S. patents. The method uses the historical data for the time between application and issue and can be used to estimate activity by application date up to one year before the date of the most recently issued patents.

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    Article provided by Elsevier in its journal World Patent Information.

    Volume (Year): 9 (1987)
    Issue (Month): 3 ()
    Pages: 137-139

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    Handle: RePEc:eee:worpat:v:9:y:1987:i:3:p:137-139
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