IDEAS home Printed from https://ideas.repec.org/a/eee/spapps/v9y1979i2p195-205.html
   My bibliography  Save this article

Simultaneous life testing in a random environment

Author

Listed:
  • Ammann, Larry P.

Abstract

Examined here is a class of multivariate lifetime distributions generated by a physical model in which a group of like devices is simultaneously exposed to a random wear or damage environment. This random wear is represented by a nonnegative stochastic process with independent increments. Associated with each device is a random threshold and the device fails when the wear attains this threshold. It is shown that tied failure times occur with positive probability. Algorithms are developed to obtain the probabilistic properties of various random variables associated with the joint failure time vector. In particular, these algorithms are used to find the probability of obtaining a specific tie configuration and the large sample behavior of the number of distinct failure times.

Suggested Citation

  • Ammann, Larry P., 1979. "Simultaneous life testing in a random environment," Stochastic Processes and their Applications, Elsevier, vol. 9(2), pages 195-205, November.
    • Handle: RePEc:eee:spapps:v:9:y:1979:i:2:p:195-205
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/0304-4149(79)90031-0
    Download Restriction: Full text for ScienceDirect subscribers only
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:spapps:v:9:y:1979:i:2:p:195-205. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: http://www.elsevier.com/wps/find/journaldescription.cws_home/505572/description#description .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.