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Multi-parameter estimation in critical quantum metrology

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  • Di Fresco, Giovanni
  • Spagnolo, Bernardo
  • Valenti, Davide
  • Carollo, Angelo

Abstract

Quantum metrology leverages the unique properties of quantum systems to enhance parameter estimation beyond classical limits. In this short review, we introduce the core concepts of quantum metrology, with a particular focus on its extension to multi-parameter estimation. We begin by outlining the foundational principles of quantum metrology and explore how quantum criticality can enhance measurement precision — especially near quantum phase transitions, where systems exhibit heightened sensitivity to external perturbations. Next, we consider the framework of multi-parameter quantum critical metrology, in which the simultaneous estimation of multiple parameters near criticality can lead to further improvements in accuracy. Finally, we discuss measurement-induced phase transitions, a phenomenon emerging in the context of continuous quantum measurements that introduces non-Hermitian dynamics and fundamentally alters the system’s behavior. This review provides a concise overview of these key developments and highlights their significance for future progress in quantum sensing technologies.

Suggested Citation

  • Di Fresco, Giovanni & Spagnolo, Bernardo & Valenti, Davide & Carollo, Angelo, 2025. "Multi-parameter estimation in critical quantum metrology," Chaos, Solitons & Fractals, Elsevier, vol. 199(P3).
    • Handle: RePEc:eee:chsofr:v:199:y:2025:i:p3:s0960077925009269
    DOI: 10.1016/j.chaos.2025.116913
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