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Properties of thin metallic films for microwave susceptors

Author

Listed:
  • J. Česnek

    (Romill, s.r.o., Brno, Czech Republic)

  • J. Dobiáš

    (Romill, s.r.o., Brno, Czech Republic)

  • J. Houšová

    (Romill, s.r.o., Brno, Czech Republic)

  • J. Sedláček

    (Romill, s.r.o., Brno, Czech Republic)

Abstract

Thin Al films of varying thickness, i.e. 3 to 30 nm, were deposited onto polyethylene-terephthalate film by evaporation in the vacuum of 3 × 10-3 Pa. The dependence of DC (direct current) surface resistance on thickness was measured using a four-point method. The surface resistance exhibits the size effect in accordance with the Fuchs-Sondheimer theory. The microwave absorption properties of the prepared films of various metallization thickness were measured in a microwave field at the microwave power of 1.8 mW. The maximum microwave absorption at 2.45 GHz was found to occur in a layer of optical density of about 0.22.

Suggested Citation

  • J. Česnek & J. Dobiáš & J. Houšová & J. Sedláček, 2003. "Properties of thin metallic films for microwave susceptors," Czech Journal of Food Sciences, Czech Academy of Agricultural Sciences, vol. 21(1), pages 34-40.
    • Handle: RePEc:caa:jnlcjf:v:21:y:2003:i:1:id:3475-cjfs
    DOI: 10.17221/3475-CJFS
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