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Multiple Dependent State Sampling Inspection Plan for Lindley Distributed Quality Characteristic

Author

Listed:
  • Biswas Shovan

    (Department of Statistics, Burdwan Raj College, Burdwan, India)

  • Maiti Sudhansu S.

    (Department of Statistics, Visva-Bharati University, Santiniketan, India)

Abstract

This article develops multiple dependent state (MDS) sampling inspection plans based on the mean of lifetime quality characteristic that follows non-normal distributions viz., exponential and Lindley distribution. In this plan, the lot quality is measured by the lot mean (𝜇). We have estimated the optimal plan parameters of the proposed technique by non-linear optimization approaches considering acceptable quality level and rejection quality level. We have compared the sample size between the MDS sampling inspection plan and the single sampling inspection plan for the variable. Finally, we have taken two examples to illustrate the proposed technique.

Suggested Citation

  • Biswas Shovan & Maiti Sudhansu S., 2022. "Multiple Dependent State Sampling Inspection Plan for Lindley Distributed Quality Characteristic," Stochastics and Quality Control, De Gruyter, vol. 37(1), pages 85-99, June.
    • Handle: RePEc:bpj:ecqcon:v:37:y:2022:i:1:p:85-99:n:6
    DOI: 10.1515/eqc-2021-0038
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