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Two‐Stage Reliability Tests with Technological Evolution: A Bayesian Analysis

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  • G. A. Whitmore
  • K. D. S. Young
  • A. C. Kimber

Abstract

The reliability of equipment is of interest to manufacturers. Frequently minor modifications are made to devices and there is insufficient time to test these modified devices fully before they must enter service. The problem of interest here is how we can use the information already obtained from the testing of a device before modification to help us to evaluate the reliability of the modified device. A Bayesian analysis allows the flexibility to use any available prior information in the analysis. In this paper we consider two different types of prior information that may be available and the resulting analyses.

Suggested Citation

  • G. A. Whitmore & K. D. S. Young & A. C. Kimber, 1994. "Two‐Stage Reliability Tests with Technological Evolution: A Bayesian Analysis," Journal of the Royal Statistical Society Series C, Royal Statistical Society, vol. 43(2), pages 295-307, June.
    • Handle: RePEc:bla:jorssc:v:43:y:1994:i:2:p:295-307
    DOI: 10.2307/2986021
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