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Development of Two-Channel Measuring Device for Dielectric Polarization Characterization

Author

Listed:
  • Ju Song Kim

    (Faculty of Electrical Engineering, Kim Chaek University of Technology)

  • Ryong Il Ri

    (Faculty of Electrical Engineering, Kim Chaek University of Technology)

  • Su Rim Kim

    (Faculty of Electrical Engineering, Kim Chaek University of Technology)

Abstract

Many researches have been widely carried out to develop techniques and devices for evaluating the quality of materials and monitoring production processes, based on measuring dielectric polarization properties, which are closely related to dielectric material properties, including molecular structure and composition of dielectric materials, molecular bonding properties. Since the polarization characteristics of dielectric materials may be influenced by some error factors, including the measuring conditions such as temperature, humidity, etc. and the measuring skill, it is more advantageous to simultaneously measure the dielectric polarization characteristics of both samples if the comparison between them is required. This paper aims both to develop a device capable of simultaneously conducting the experiments of dielectric polarization characteristics for two dielectric samples and to verify its performance accuracy.

Suggested Citation

  • Ju Song Kim & Ryong Il Ri & Su Rim Kim, 2025. "Development of Two-Channel Measuring Device for Dielectric Polarization Characterization," International Journal of Research and Innovation in Applied Science, International Journal of Research and Innovation in Applied Science (IJRIAS), vol. 10(9), pages 724-730, October.
    • Handle: RePEc:bjf:journl:v:10:y:2025:i:9:p:724-730
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