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Development of Experimental Device for Frequency Dependence of Electro-Physical Properties of Highly Conductive Dielectrics Based on Three-Voltage Method

Author

Listed:
  • Hui Won Pak

    (Faculty of Electrical Engineering, Kim Chaek University of Technology)

  • Chon Ung Kim

    (Faculty of Electrical Engineering, Kim Chaek University of Technology)

  • Yu Song Kim

    (Faculty of Electrical Engineering, Kim Chaek University of Technology)

Abstract

In the case of highly conductive dielectric materials such as water and other aqueous liquids, semi-conductive stress grading materials, etc., there are some difficulties and limitations in measuring their electro-physical parameters using the measurement methods and conventional metal electrodes. This paper describes the development of an experimental device capable of measuring dielectric permittivity and dielectric loss tangent of the above-mentioned highly conductive dielectric materials in the comparatively wide frequency range of power frequencies to 1 MHz, the principle of which is based on the three-voltage method; and also, it has been dealt with how to design the hardware and software. The operating characteristic and reliability of the designed and manufactured experimental device were verified through the simulation by using electrical equivalent circuit method and comparing with the measurement data for the standard experiment device.

Suggested Citation

  • Hui Won Pak & Chon Ung Kim & Yu Song Kim, 2025. "Development of Experimental Device for Frequency Dependence of Electro-Physical Properties of Highly Conductive Dielectrics Based on Three-Voltage Method," International Journal of Research and Innovation in Applied Science, International Journal of Research and Innovation in Applied Science (IJRIAS), vol. 10(10), pages 241-248, October.
    • Handle: RePEc:bjf:journl:v:10:y:2025:i:10:p:241-248
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