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Unit root tests with a break in innovation variance Author info | Abstract | Publisher info | Download info | Related research | Statistics Kim, Tae-Hwan
Leybourne, Stephen
Newbold, Paul
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Article provided by Elsevier in its journal Journal of Econometrics .
Volume (Year): 109 (2002)
Issue (Month): 2 (August)
Pages: 365-387
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Handle: RePEc:eee:econom:v:109:y:2002:i:2:p:365-387Contact details of provider: Web page: http://www.elsevier.com/locate/jeconom
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