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Patents, R&D and lag effects: evidence from flexible methods for count panel data on manufacturing firms Author info | Abstract | Publisher info | Download info | Related research | Statistics Shiferaw Gurmu ()
Fidel Pérez-Sebastián
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Article provided by Springer in its journal Empirical Economics .
Volume (Year): 35 (2008)
Issue (Month): 3 (November)
Pages: 507-526
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Handle: RePEc:spr:empeco:v:35:y:2008:i:3:p:507-526Contact details of provider: Web page: http://link.springer.de/link/service/journals/00181/index.htm
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Keywords: Innovative activity ; Patents and R& ; D ; Individual effects ; Count panel data methods ; C20 ; O30 ; References listed on IDEAS Please report citation or reference errors to , or , if you are the registered author of the cited work, log in to your RePEc Author Service profile , click on "citations" and make appropriate adjustments.:
Griliches, Zvi, 1990.
"Patent Statistics as Economic Indicators: A Survey ,"
Journal of Economic Literature ,
American Economic Association, vol. 28(4), pages 1661-1707, December.
[Downloadable!] (restricted)
Other versions: Wang, Peiming & Cockburn, Iain M & Puterman, Martin L, 1998.
"Analysis of Patent Data--A Mixed-Poisson-Regression-Model Approach ,"
Journal of Business & Economic Statistics ,
American Statistical Association, vol. 16(1), pages 27-41, January.
Blundell, Richard & Griffith, Rachel & Van Reenen, John, 1995.
"Dynamic Count Data Models of Technological Innovation ,"
Economic Journal ,
Royal Economic Society, vol. 105(429), pages 333-44, March.
[Downloadable!] (restricted)
Other versions: Crepon, Bruno & Duguet, Emmanuel, 1997.
"Estimating the Innovation Function from Patent Numbers: GMM on Count Panel Data ,"
Journal of Applied Econometrics ,
John Wiley & Sons, Ltd., vol. 12(3), pages 243-63, May-June.
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repec:fth:harver:1473 is not listed on IDEAS
Blundell, Richard & Griffith, Rachel & Windmeijer, Frank, 2002.
"Individual effects and dynamics in count data models ,"
Journal of Econometrics ,
Elsevier, vol. 108(1), pages 113-131, May.
[Downloadable!] (restricted)
Other versions: Gurmu, Shiferaw & Rilstone, Paul & Stern, Steven, 1998.
"Semiparametric estimation of count regression models1 ,"
Journal of Econometrics ,
Elsevier, vol. 88(1), pages 123-150, November.
[Downloadable!] (restricted)
Acs, Zoltan J & Audretsch, David B, 1989.
"Patents as a Measure of Innovative Activity ,"
Kyklos ,
Blackwell Publishing, vol. 42(2), pages 171-80.
Wooldridge, Jeffrey M., 1997.
"Multiplicative Panel Data Models Without the Strict Exogeneity Assumption ,"
Econometric Theory ,
Cambridge University Press, vol. 13(05), pages 667-678, October.
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This page was last updated on 2009-12-31.
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