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Semiparametric estimation of count regression models1

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Author Info
Gurmu, Shiferaw
Rilstone, Paul
Stern, Steven

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File URL: http://www.sciencedirect.com/science/article/B6VC0-3V72SCP-N/2/a89bab7f6c79bad5e3c3324da93e9a14
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Article provided by Elsevier in its journal Journal of Econometrics.

Volume (Year): 88 (1998)
Issue (Month): 1 (November)
Pages: 123-150
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Handle: RePEc:eee:econom:v:88:y:1998:i:1:p:123-150

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Web page: http://www.elsevier.com/locate/jeconom

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  1. Fidel Pérez Sebastián & Shiferaw Gurmu, 2007. "Patents, R&D And Lag Effects: Evidence From Flexible Methods For Count Panel Data On Manufacturing Firms," Working Papers. Serie AD 2007-03, Instituto Valenciano de Investigaciones Económicas, S.A. (Ivie). [Downloadable!]
  2. Halkos, George & Tzeremes, Nickolaos, 2007. "Corruption and Socioeconomics Determinants:Empirical Evidence of Twenty Nine Countries," MPRA Paper 2874, University Library of Munich, Germany. [Downloadable!]
  3. Michael Creel & Montserrat Farell, 2005. "Modeling Usage of Medical Care Services: The Medical Expenditure Panel Survey Data, 1996-2000," UFAE and IAE Working Papers 646.05, Unitat de Fonaments de l'Anàlisi Econòmica (UAB) and Institut d'Anàlisi Econòmica (CSIC). [Downloadable!]
  4. Shiferaw Gurmu & Fidel Pérez-Sebastián, 2008. "Patents, R&D and lag effects: evidence from flexible methods for count panel data on manufacturing firms," Empirical Economics, Springer, vol. 35(3), pages 507-526, November. [Downloadable!] (restricted)
  5. Margarita E. Romero Rodríguez & Enrique Los Arcos & Victor Cano Fernández & Miguel Sánchez Padrón, 2001. "Modelo para datos de recuentro de corte transversal con exceso de ceros. Aplicación a citas patentes," Documentos de trabajo conjunto ULL-ULPGC 2001-05, Facultad de Ciencias Económicas de la ULPGC. [Downloadable!]
  6. José Santos & M. Neves, 2008. "A local maximum likelihood estimator for Poisson regression," Metrika, Springer, vol. 68(3), pages 257-270, November. [Downloadable!] (restricted)
  7. Stefan Boes, 2007. "Count Data Models with Unobserved Heterogeneity: An Empirical Likelihood Approach," Working Papers 0704, University of Zurich, Socioeconomic Institute. [Downloadable!]
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