A second order approach to analyse spatial point patterns with functional marks
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Bibliographic InfoArticle provided by Springer in its journal TEST.
Volume (Year): 20 (2011)
Issue (Month): 3 (November)
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Web page: http://www.springerlink.com/link.asp?id=120411
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- Martin Schlather & Paulo J. Ribeiro & Peter J. Diggle, 2004. "Detecting dependence between marks and locations of marked point processes," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 66(1), pages 79-93.
- Renshaw, Eric & Mateu, Jorge & Saura, Fuensanta, 2007. "Disentangling mark/point interaction in marked-point processes," Computational Statistics & Data Analysis, Elsevier, vol. 51(6), pages 3123-3144, March.
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