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On designing step-stress partially accelerated life tests under failure-censoring scheme

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  • Ali A Ismail

Abstract

In this article the maximum likelihood estimates of the model parameters under step-stress partially accelerated life tests (SSPALT) are obtained assuming the Weibull distribution with Type-II censored data. Also, the confidence bounds of the parameters are obtained. In addition, optimum step stress test plans are developed. The optimum test plan determines the optimal stress change point that minimizes the generalized asymptotic variance of the maximum likelihood estimators for the model parameters. That is, improving the quality of the statistical inference.

Suggested Citation

  • Ali A Ismail, 2013. "On designing step-stress partially accelerated life tests under failure-censoring scheme," Journal of Risk and Reliability, , vol. 227(6), pages 662-670, December.
    • Handle: RePEc:sae:risrel:v:227:y:2013:i:6:p:662-670
    DOI: 10.1177/1748006X13489070
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    References listed on IDEAS

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    1. Morris H. Degroot & Prem K. Goel, 1979. "Bayesian estimation and optimal designs in partially accelerated life testing," Naval Research Logistics Quarterly, John Wiley & Sons, vol. 26(2), pages 223-235, June.
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