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Nonparametric Approach to Patent Citations

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  • Petr Mariel
  • Susan Orbe

Abstract

The present article reexamines some of the issues regarding the benchmarking of patents using the NBER data base on U.S. patents by generalizing a parametric citation model and by estimating it using Generalized Additive Models (GAM) methodology. The main conclusion is that the estimated effects differ considerably from sector to sector, and the differences can be estimated nonparametrically but not by the parametric dummy variable approach.

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Bibliographic Info

Article provided by University of Economics, Prague in its journal Prague Economic Papers.

Volume (Year): 2009 (2009)
Issue (Month): 3 ()
Pages: 251-266

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Handle: RePEc:prg:jnlpep:v:2009:y:2009:i:3:id:353:p:251-266

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Related research

Keywords: USPTO; patent benchmarking; GAM;

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References

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  1. Basberg, Bjorn L., 1987. "Patents and the measurement of technological change: A survey of the literature," Research Policy, Elsevier, vol. 16(2-4), pages 131-141, August.
  2. Bronwyn H. Hall & Adam Jaffe & Manuel Trajtenberg, 2002. "Market Value and Patent Citations: A First Look," Development and Comp Systems 0201001, EconWPA.
  3. repec:fth:harver:1473 is not listed on IDEAS
  4. Griliches, Zvi, 1990. "Patent Statistics as Economic Indicators: A Survey," Journal of Economic Literature, American Economic Association, vol. 28(4), pages 1661-1707, December.
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