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Reliability modeling of mixtures of one-shot units under thermal cyclic stresses

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  • Cheng, Yao
  • Elsayed, Elsayed A.

Abstract

Modeling components’ thermal fatigue life due to cyclic temperature fluctuation based on Coffin–Mason principle has been extensively investigated. However, sparse research assesses the thermal fatigue life by providing the reliability metrics of components/systems under thermal fatigue. The Birnbaum–Saunders (BS) distribution is developed to model the unit's fatigue failure induced by mechanical stresses and provides the unit's reliability metrics. In this paper, we investigate a generalized Birnbaum–Saunders (GBS) distribution and its performance in predicting fatigue failure caused by thermal cyclic stresses. We then apply the GBS distribution to model the reliability metrics of a system with mixtures of nonhomogeneous one-shot units subject to thermal fatigue. An extensive simulation model is developed to validate the system reliability metrics accuracy. Numerical examples are presented to illustrate the use of the models.

Suggested Citation

  • Cheng, Yao & Elsayed, Elsayed A., 2017. "Reliability modeling of mixtures of one-shot units under thermal cyclic stresses," Reliability Engineering and System Safety, Elsevier, vol. 167(C), pages 58-66.
    • Handle: RePEc:eee:reensy:v:167:y:2017:i:c:p:58-66
    DOI: 10.1016/j.ress.2017.05.018
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    References listed on IDEAS

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    1. Newby, Martin, 2008. "Monitoring and maintenance of spares and one shot devices," Reliability Engineering and System Safety, Elsevier, vol. 93(4), pages 588-594.
    2. Kundu, Debasis & Kannan, Nandini & Balakrishnan, N., 2008. "On the hazard function of Birnbaum-Saunders distribution and associated inference," Computational Statistics & Data Analysis, Elsevier, vol. 52(5), pages 2692-2702, January.
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    Cited by:

    1. Cheng, Yao & Elsayed, Elsayed A., 2018. "Reliability modeling and optimization of operational use of one-shot units," Reliability Engineering and System Safety, Elsevier, vol. 176(C), pages 27-36.
    2. Zhu, Xiaojun & Liu, Kai & He, Mu & Balakrishnan, N., 2021. "Reliability estimation for one-shot devices under cyclic accelerated life-testing," Reliability Engineering and System Safety, Elsevier, vol. 212(C).
    3. Ling, M.H. & Hu, X.W., 2020. "Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
    4. Ye, Xuerong & Hu, Yifan & Zheng, Bokai & Chen, Cen & Zhai, Guofu, 2022. "A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling," Reliability Engineering and System Safety, Elsevier, vol. 228(C).
    5. Man-Ho Ling & Narayanaswamy Balakrishnan & Chenxi Yu & Hon Yiu So, 2021. "Inference for One-Shot Devices with Dependent k -Out-of- M Structured Components under Gamma Frailty," Mathematics, MDPI, vol. 9(23), pages 1-24, November.
    6. Zhu, Xiaojun & Balakrishnan, N., 2022. "One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications," Reliability Engineering and System Safety, Elsevier, vol. 221(C).

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