Optimal burn-in for maximizing reliability of repairable non-series systems
AbstractBurn-in is a manufacturing process applied to products to eliminate early failures in the factory before the products reach the customers. Various methods have been proposed for determining an optimal burn-in time of a non-repairable system or a repairable series system, assuming that system burn-in improves all components in the system. In this paper, we establish the trade-off between the component reliabilities during system burn-in and develop an optimal burn-in time for repairable non-series systems to maximize reliability. One impediment to expressing the reliability of a non-series system is in that successive failures during system burn-in cannot be described precisely because a failed component is not detected until the whole system fails. For approximating the successive failures of a non-series system during system burn-in, we considered two types of repair: minimal repair at the time of system failure, and repair at the time of component or connection failure. The two types of repair provide bounds on the optimal system burn-in time of non-series systems.
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Bibliographic InfoArticle provided by Elsevier in its journal European Journal of Operational Research.
Volume (Year): 193 (2009)
Issue (Month): 1 (February)
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Web page: http://www.elsevier.com/locate/eor
Failure rate Infant mortality failures Minimal repair;
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- Sheu, Shey-Huei & Chien, Yu-Hung, 2005. "Optimal burn-in time to minimize the cost for general repairable products sold under warranty," European Journal of Operational Research, Elsevier, vol. 163(2), pages 445-461, June.
- Chang, Dong Shang, 2000. "Optimal burn-in decision for products with an unimodal failure rate function," European Journal of Operational Research, Elsevier, vol. 126(3), pages 534-540, November.
- Si, Xiao-Sheng & Wang, Wenbin & Hu, Chang-Hua & Zhou, Dong-Hua, 2011. "Remaining useful life estimation - A review on the statistical data driven approaches," European Journal of Operational Research, Elsevier, vol. 213(1), pages 1-14, August.
- Kim, Kyungmee O., 2011. "Burn-in considering yield loss and reliability gain for integrated circuits," European Journal of Operational Research, Elsevier, vol. 212(2), pages 337-344, July.
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