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Reliability Test Plans for Percentiles Based on the Harris Generalized Linear Exponential Distribution

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  • Jose K. K.

    (Department of Statistics, St.Thomas College Pala, Arunapuram; and Mahathma Gandhi University, Kottayam, Kerala, 686574India)

  • Paul Albin

    (Department of Statistics, St.Thomas College Pala, Arunapuram; and Mahathma Gandhi University, Kottayam, Kerala, 686574India)

Abstract

In this paper, a generalization of the Harris family of distributions, namely, the Harris generalized linear exponential distribution is discussed. The use of the model is established by fitting it to a real data set. Also, we derive a reliability test plan for acceptance or rejection of a lot of products submitted for inspection with lifetimes following this distribution.

Suggested Citation

  • Jose K. K. & Paul Albin, 2018. "Reliability Test Plans for Percentiles Based on the Harris Generalized Linear Exponential Distribution," Stochastics and Quality Control, De Gruyter, vol. 33(1), pages 61-70, June.
  • Handle: RePEc:bpj:ecqcon:v:33:y:2018:i:1:p:61-70:n:3
    DOI: 10.1515/eqc-2017-0025
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    References listed on IDEAS

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    1. Jose K. K. & Sivadas Remya, 2015. "Negative Binomial Marshall–Olkin Rayleigh Distribution and Its Applications," Stochastics and Quality Control, De Gruyter, vol. 30(2), pages 89-98, December.
    2. Tzong-Ru Tsai & Shuo-Jye Wu, 2006. "Acceptance sampling based on truncated life tests for generalized Rayleigh distribution," Journal of Applied Statistics, Taylor & Francis Journals, vol. 33(6), pages 595-600.
    3. Jose Kanichukattu Korakutty & Sebastian Rani, 2013. "Marshall–Olkin Morgenstern–Weibull distribution: generalisations and applications," Stochastics and Quality Control, De Gruyter, vol. 28(2), pages 1-12, December.
    4. Rosaiah K. & Kantam R. R. L., 2005. "Acceptance Sampling Based on the Inverse Rayleigh Distribution," Stochastics and Quality Control, De Gruyter, vol. 20(2), pages 277-286, January.
    5. R. R. L. Kantam & K. Rosaiah & G. Srinivasa Rao, 2001. "Acceptance sampling based on life tests: Log-logistic model," Journal of Applied Statistics, Taylor & Francis Journals, vol. 28(1), pages 121-128.
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